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Kelvin probe force microscopy of metallic surfaces used in Casimir force measurements

机译:用于卡西米尔力的金属表面的开尔文探针力显微镜   测量

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摘要

Kelvin probe force microscopy at normal pressure was performed by twodifferent groups on the same Au-coated planar sample used to measure theCasimir interaction in a sphere-plane geometry. The obtained voltagedistribution was used to calculate the separation dependence of theelectrostatic pressure $P_{\rm res}(D)$ in the configuration of the Casimirexperiments. In the calculation it was assumed that the potential distributionin the sphere has the same statistical properties as the measured one, and thatthere are no correlation effects on the potential distributions due to thepresence of the other surface. Within this framework, and assuming that thepotential distribution does not vary significantly at low pressure, thecalculated $P_{\rm res}(D)$ does not explain the magnitude or the separationdependence of the difference $\Delta P (D)$ between the measured Casimirpressure and the one calculated using a Drude model for the electromagneticresponse of Au.
机译:常压下的开尔文探针力显微镜法是由两个不同的组在同一金涂层的平面样品上进行的,该样品用于测量球面几何形状中的卡西米尔相互作用。所获得的电压分布用于计算在卡西米尔实验的配置中静电压力$ P _ {\ rm res}(D)$的分离依赖性。在计算中,假定球体中的电势分布具有与被测球体相同的统计特性,并且由于存在另一个表面而对电势分布没有相关影响。在此框架内,并假设在低压下电位分布不会显着变化,则计算出的$ P _ {\ rm res}(D)$不能解释差异$ \ Delta P(D)$的大小或分离依赖性。测量卡西米尔压力,并使用Drude模型对Au的电磁响应进行计算。

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